Skip to main content
Add Me To Your Mailing List
 Calendar        |         Newsletter         |            Jobs Board         |         Classes         |         Contact Us    
Upcoming Events
Upcoming Events


The Photonics Society
National Photonics Initiative
International Day of Light


Äpre Instruments
Cambridge Technology
Diverse Optics
e-Las Americas
4D Technology
Hadland Imaging
Infinite Optics

Mahr Metrology
Micro Laser Systems
Mindrum Precision
Newport Thin Film Labs
Ohara Corporation
Optic Systems Group
Photonics Media
Raytheon - Elcan
Raytheon SAS
Reynard Corporation
Schott North America
Welcome Members
Welcome New Members

OSSC welcomes Individual and Corporate
Members who joined (or rejoined) in the last 60 days.

We value your membership
and appreciate your support!
HomeEventsOSSC March Meeting

Events - Event View

This is the "Event Detail" view, showing all available information for this event. If the event has passed, click the "Event Report" button to read a report and view photos that were uploaded.

OSSC March Meeting

Wednesday, March 14, 2018
Sodexo @ Pickwick Gardens
Pickwick Conf Center
1001 West Riverside Drive
Burbank, CA  91506

Donn M Silberman
OSSC Regular Meeting
Registration is recommended
Payment In Advance Or At Event
Cancellation Policy:
Please let the Arrangements Chair ("") know as soon as possible.

Payments made in advance will normally be issued a credit that may be applied to future payments (membership or events). Please contact the Treasurer ("") for assistance if this posses a significant burden.
Activities/Items    (Click the down-arrow to the left of the activity/item to view the details)
Sponsor a Student
Sponsor a Table
Donate to the OSSC (Suggested Donation)
An Introduction to Spectrally Controlled
Interferometry for the Measurement of Flat and Spherical Optics

Donald (Don) A. Pearson II
Äpre Instruments, Tucson, Arizona
Conventional interferometry is widely used to measure spherical and flat surfaces with nanometer level precision but it is often plagued by back or multiple surface reflections.  At this meeting, a new method of isolating the measurement surface by controlling the spectral properties of the source (Spectrally Controlled Interferometry - SCI) will be described.  Using spectral modulation of the interferometer's source enables formation of localized fringes where the optical path difference is non-zero.  As a consequence, it becomes possible to form white-light like fringes in common path interferometers, such as the Fizeau or Twyman-Green.  SCI technology does not require mechanical phase shifting, resulting in simpler instruments and offers the ability to upgrade existing interferometers.  Furthermore, SCI allows absolute measurement of distance, including radius of curvature of lenses, in a single setup with the possibility of improving the throughput and removing some of the pitfalls of inaccurate measurements.

The OSSC is a non-profit 501(C)3 tax exempt corporation.
The OSSC does NOT endorse candidates for public office or contribute to political candidates or campaigns.

Updated: 17 May 2019
Activated 2019-2020 BoD Election