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OSSC March 14 Meeting
Wednesday, March 14, 2018
Sodexo @ Pickwick Gardens
Pickwick Conf Center
1001 West Riverside Drive
Burbank, CA 91506
OSSC Regular Meeting
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An Introduction to Spectrally Controlled
Interferometry for the Measurement of Flat and Spherical Optics
Donald (Don) A. Pearson II
Äpre Instruments, Tucson, Arizona
Conventional interferometry is widely used to measure spherical and flat surfaces with nanometer level precision but it is often plagued by back or multiple surface reflections. At this meeting, a new method of isolating the measurement surface by controlling the spectral properties of the source (Spectrally Controlled Interferometry - SCI) will be described. Using spectral modulation of the interferometer's source enables formation of localized fringes where the optical path difference is non-zero. As a consequence, it becomes possible to form white-light like fringes in common path interferometers, such as the Fizeau or Twyman-Green. SCI technology does not require mechanical phase shifting, resulting in simpler instruments and offers the ability to upgrade existing interferometers. Furthermore, SCI allows absolute measurement of distance, including radius of curvature of lenses, in a single setup with the possibility of improving the throughput and removing some of the pitfalls of inaccurate measurements.